We present a method for characterizing transceiver performance in parallel optical data links. By establishing a bidirectional link between two optically enabled chips, the conditions for a ring oscillator are made possible. We propose this technique as a means of measuring the sensitivity of transceiver latency to controlled variables such as temperature, optical output power, supply voltage, and device misalignment. This method is noninvasive and independent of the packaging, circuit topology, and optical medium used. The technique is demonstrated experimentally, and results are compared with a simulation.
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