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首页> 外文期刊>Applied optics >Scattering of light by a periodic structure in the presence of randomness. III. Limit of the extended matched filtering method for the detection of weak periodicities
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Scattering of light by a periodic structure in the presence of randomness. III. Limit of the extended matched filtering method for the detection of weak periodicities

机译:在存在随机性的情况下,光通过周期性结构散射。三,扩展匹配滤波方法在弱周期检测中的局限性

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摘要

It is known that, for scattering of light by a rough grating, the periodically occurring intensity maxima that are characteristic of the periodic part of the scattering medium get smeared off and hence become undetectable if coherence length r_(o) of the randomness is much smaller than wavelength A of the periodic part of the grating. It is also known that by conventional intensity measurements the detectability region is r_(o)/Λ≥0.33, which can be extended to lower regions by intensity interferometry. It is established here that an extended matched filtering method enables one to detect the periodic part of the medium, even in the presence of higher roughness (i.e., lower r_(o)), and the limit is placed at r_(o)/Λ≈0.11 by our numerical experiments.
机译:已知的是,对于由粗糙的光栅进行的光散射而言,作为散射介质的周期性部分的特征的周期性出现的强度最大值被涂抹掉,因此如果随机性的相干长度r_(o)小得多,则变得不可检测。比光栅的周期性部分的波长A大。还已知通过常规强度测量,可检测区域是r_(o)/Λ≥0.33,其可以通过强度干涉术扩展到较低区域。此处确定了一种扩展的匹配滤波方法,即使存在较高的粗糙度(即,较低的r_(o)),也可以检测介质的周期性部分,并且将限制设置为r_(o)/Λ根据我们的数值实验,≈0.11。

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