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Каталитическое  плазменное  анодирование  кремния  на  поверхности  с  радиационными  дефектами

机译:具有辐射缺陷的表面上硅的催化等离子体阳极氧化

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摘要

A new method of high-quality silica filmsproduction by catalytic plasma anodizing of silicon with surfaceradiation defects introduced by preliminary ion implantation hasbeen proposed. It was shown, that in this way it is possible toreduce a temperature of the process down to 423 K as well as toincrease significantly the process rate and effectiveness. Effectof near the surface radiation defects on the kinetics of plasmaanodizing process is explained.
机译:提出了一种通过预离子注入引入表面辐射缺陷的硅催化等离子体阳极氧化生产高质量二氧化硅薄膜的新方法。结果表明,通过这种方式可以将工艺温度降低到423 K,并且可以显着提高工艺速度和效率。解释了近表面辐射缺陷对等离子体阳极氧化过程动力学的影响。

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