A new algorithm for SIP parameter estimation from multi-frequency IP data: preliminary results

摘要

Conventional analysis of spectral induced polarization (SIP) data consists of measuring impedances over a range of frequencies, followed by spectral analysis to estimate spectral parameters. For the quantitative and accurate estimation of subsurface SIP parameter distribution, however, a sophisticated and stable inversion technique is required. In this study, we have developed a two-step inversion approach to obtain the two-dimensional distribution of SIP parameters. In the first inversion step, all the SIP data measured over a range of frequencies are simultaneously inverted, adopting cross regularisation of model complex resistivities at each frequency. The cross regularisation makes it possible to enhance the noise characteristics of the inversion by imposing a strong assumption, that complex resistivities should show similar characteristics over a range of frequencies. In numerical experiments, we could verify that our inversion approach successfully reduced inversion artefacts. As a second step, we have also developed an inversion algorithm to obtain SIP parameters based on the Cole-Cole model, in which frequency-dependent complex resistivities from the first step are inverted to obtain a two-dimensional distribution of SIP parameters. In numerical tests, the SIP parameter images showed a fairly good match with the exact model, which suggests that SIP imaging can provide a very useful subsurface image to complement resistivity.