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A 1D- and 2D-NMR Study of an Anionic Surfactant/Neutral Polymer Complex

机译:阴离子表面活性剂/中性聚合物配合物的1D和2D-NMR研究

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NMR chemical shifts and linewidth measurements were examined for mixtures of sodium 10-phenyl-decanoate (Na ω-PhDec) in deuterated aqueous solutions in the presence of varying compositions of poly(ethylene oxide) (PEO) polymers of 2000 and 4000 molecular weight. In addition, variable temperature NMR spectra and NMR spin lattice relaxation times (T1) were obtained for the PEO-4000/Na ω-PhDec system as a function of varying polymer concentrations. As expected, the polymer/surfactant systems exhibit the behaviour typical of that of an anionic surfactant/ neutral polymer system with well denned critical aggregation concentrations (CMC) corresponding to the formation of polymer/surfactant complexes below the CMC of the free surfactant. The ~1H-NMR linewidths acquired for the Na ω-PhDec/PEO-4000 system before and after the CMC region of the surfactant indicate that the maximum in the linewidth of the PEO proton peak is reached at approximately twice the CMC of the free surfactant. 2D-NMR NOESY measurements on this system exhibit cross peaks between the PEO protons and the protons on the surfactant backbone, consistent with the location of the phenyl group in the micellar interior. All these NMR experiments are interpreted in terms of the structure of the polymer/surfactant complexes as a function of the system composition.
机译:在氘化水溶液中,在分子量为2000和4000的聚环氧乙烷(PEO)聚合物组成不同的情况下,对10-苯基癸酸钠(Naω-PhDec)混合物的NMR化学位移和线宽测量进行了检查。另外,对于PEO-4000 / Naω-PhDec系统,随聚合物浓度的变化,获得了可变温度的NMR光谱和NMR自旋晶格弛豫时间(T1)。如所预期的,聚合物/表面活性剂体系表现出具有典型的阴离子表面活性剂/中性聚合物体系的行为,具有充分确定的临界聚集浓度(CMC),其对应于游离表面活性剂的CMC以下的聚合物/表面活性剂复合物的形成。在表面活性剂的CMC区域前后,Naω-PhDec/ PEO-4000系统获得的〜1H-NMR线宽表明,PEO质子峰的线宽最大值达到了游离表面活性剂的CMC的大约两倍。 。在该系统上的2D-NMR NOESY测量显示PEO质子和表面活性剂主链上的质子之间的交叉峰,与胶束内部苯基的位置一致。所有这些NMR实验都是根据聚合物/表面活性剂配合物的结构作为系统组成的函数来解释的。

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