首页> 外文期刊>The Journal of Adhesion >Ultrasonic Guided Waves Scattering Effects From Defects in Adhesively Bonded Lap Joints Using Pitch and Catch and Pulse-Echo Techniques
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Ultrasonic Guided Waves Scattering Effects From Defects in Adhesively Bonded Lap Joints Using Pitch and Catch and Pulse-Echo Techniques

机译:使用间距和捕捉和脉冲回波技术在粘合的搭接接头中的缺陷处产生的超声波导波散射效应

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摘要

In this article a method to evaluate defect dimensions in adhesively bonded lap joints based on the measurement of scattering effects of ultrasonic guided waves is presented.A simplified theoretical model is proposed which was initially tested in plates with through holes.The experimental results obtained using both pitch-and-catch and pulse-echo techniques for 500 kHz and 1MHz frequencies confirm the validity of this model.To evaluate the lap joint defects,a set of samples with artificial defects were manufactured and the form and dimensions were confirmed using C-scan ultrasonic images.With the same methodology used in through-hole analysis,scattering effects of defects were measured.The results obtained with the pitch-and-catch technique with 1MHz transducers allow us to say that an estimate of defect dimensions could be done by using the proposed model with reasonable accuracy and according with the predictions.
机译:本文提出了一种基于超声导波散射效应的搭接搭接接头缺陷尺寸评估方法,并提出了一种简化的理论模型,该模型最初在带有通孔的平板中进行了测试,两者均获得了实验结果。在500 kHz和1MHz频率上的音调捕获和脉冲回波技术证实了该模型的有效性。为了评估搭接接头缺陷,制造了一组带有人工缺陷的样品,并使用C扫描确认了形式和尺寸超声图像。使用与通孔分析相同的方法,测量缺陷的散射效应。使用1MHz传感器的间距捕获技术获得的结果使我们可以说,可以通过使用提出的模型具有合理的准确性并符合预测。

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