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Interface roughening in systems with quenched disorder

机译:淬火无序系统中的界面粗糙化

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摘要

We present a theoretical framework for the discussion of the scaling properties of interfaces advancing in systems with quenched disorder. In all such systems there are critical conditions at which the interface gains scale invariance for sufficiently slow growth. There are two fundamental concepts, the ``blocking surfaces'' and the ``associated processes,'' whose nature determines the scaling properties of the advancing interfaces at criticality. The associated processes define a network whose scaling properties determine all the exponents (static and dynamic) that characterize the critical growing interface via universal scaling relations. We point out in this paper that most of the physical rules that can be used to advance the interface also incorporate noncritical elements; as a result, the roughness exponent of the growing interface may deviate from that of the critical interface in a rule-dependent way. We illustrate the wide applicability of the universal scaling relations with diverse models, such as the Edwards-Wilkinson (EW) model with quenched noise, the random-field Ising model, and the Kardar-Parisi-Zhang (KPZ) model with quenched noise. It is shown that the last model is characterized by bounded slopes, whereas in the EW model the slopes are unbounded. This fact makes the KPZ model equivalent to the self-organized interface depinning model of Buldyrev and Sneppen.
机译:我们提供了一个理论框架,用于讨论淬灭系统中推进的界面的缩放性质。在所有此类系统中,都存在一些关键条件,在这些条件下,界面会获得尺度不变性,从而无法充分缓慢地生长。有两个基本概念,“阻塞表面”和“关联过程”,其性质决定了临界状态下前进界面的缩放特性。关联的过程定义了一个网络,其缩放属性确定了所有指数(静态和动态),这些指数通过通用缩放关系来表征关键的增长接口。我们在本文中指出,可用于推进界面的大多数物理规则还包含非关键元素;这些基本规则都包含非关键元素。结果,生长的界面的粗糙度指数可能以规则相关的方式偏离临界界面的粗糙度指数。我们说明了具有不同模型的通用比例关系的广泛适用性,例如具有猝灭噪声的Edwards-Wilkinson(EW)模型,随机场Ising模型和具有猝灭噪声的Kardar-Parisi-Zhang(KPZ)模型。结果表明,最后一个模型的特征是有界斜率,而在EW模型中,斜率是无界的。这一事实使KPZ模型等效于Buldyrev和Sneppen的自组织接口固定模型。

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