...
首页> 外文期刊>Wireless Design & Development >Micro Electro-mechanical Systems Testing and Failure-analysis Challenges
【24h】

Micro Electro-mechanical Systems Testing and Failure-analysis Challenges

机译:微机电系统测试和故障分析挑战

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

MEMS are being seen as one of the most promising emerging tech-nologies to advance the development of next generation wireless devices.. MEWS promises to shrink devices, lower power requirements and, most importantly, enable new and cutting-edge applications. Although MEMS (Micro Electro-Mechanical Systems) have been around for a number of years, only recently has the technology started to hit the mainstream. Within the last five years, the rate of diversification of MEMS has increased notably into areas such as sensors and actuators, optical switches and reflectors, microflu-idics and, of course, RF.
机译:MEMS被视为推动下一代无线设备发展的最有前途的新兴技术之一。MEWS承诺缩小设备尺寸,降低功耗要求,最重要的是,使新的尖端应用成为可能。尽管MEMS(微机电系统)已经存在了很多年,但直到最近,这项技术才开始成为主流。在过去的五年中,MEMS的多样化速度显着提高,例如传感器和致动器,光学开关和反射器,微流体技术,当然还有RF。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号