Short-wave infrared enhances machine vision

摘要

Light source selection in the SWIR is very critical to achieve a successful imaging solution. The SWIR band can enable differentiation and detection of defects which are invisible to the naked eye. To image specific traits developers must understand how to specify the correct light source. Standard visible LED lights will be ineffective, so it is important to understand the reflective properties of the materials that are being analyzed in the image. This allows for the proper matching of the correct light source and camera to simplify the machine vision application and eliminate the need for expensive and intensive processing algorithms in the visible band.