首页> 外文期刊>TsAGI science journal >INVESTIGATION OF CRACK PROPAGATION PROCESS BY MEASUREMENTS OF LOCAL DEFORMATION RESPONSE: Ⅱ. RESIDUAL STRESS FIELD
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INVESTIGATION OF CRACK PROPAGATION PROCESS BY MEASUREMENTS OF LOCAL DEFORMATION RESPONSE: Ⅱ. RESIDUAL STRESS FIELD

机译:通过局部变形响应的测量研究裂纹扩展过程:Ⅱ。残余应力场

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摘要

The principal questions in relation to determining the fracture mechanics parameters for cracks in a residual stress field are analyzed using a modified version of the crack compliance method. It is shown that this approach can be effectively used for non-symmetrical cracks, which appear near a welded seam. Detailed metrological verification of the process used to generate initial experimental data is presented. The procedure is based on comparing corresponding values measured by reflection hologram interferometry and electronic speckle interferometry. Special attention is paid to the measurements of the in-plane displacement components near the area of local material removal. Both residual stress determination and determination of the stress intensity factor (SIF) and T-stress values for a small crack length increment are considered for the same residual stress field. For this purpose, a scheme for a combined interferometer is developed and realized. This optical system is capable of simultaneous measurement of the local deformation response by two different interference techniques on opposite faces of a thin plate. The practical implementation of the developed technique is illustrated by constructing dependencies of the SIF and T-stress values from a crack length, which is located in the vicinity of the joint made by electronic beam welding.
机译:使用改进的裂缝柔量方法分析了与确定残余应力场中裂缝的断裂力学参数有关的主要问题。结果表明,该方法可以有效地用于非对称裂纹,该裂纹出现在焊缝附近。介绍了用于生成初始实验数据的过程的详细计量验证。该程序基于比较通过反射全息干涉法和电子散斑干涉法测得的相应值。要特别注意在局部材料去除区域附近的平面内位移分量的测量。对于相同的残余应力场,应考虑残余应力的确定以及应力强度因子(SIF)和T应力值的确定(对于较小的裂纹长度增量)。为此目的,开发并实现了一种用于组合干涉仪的方案。该光学系统能够通过两种不同的干涉技术同时测量薄板相对面上的局部变形响应。通过从裂纹长度构造SIF和T应力值的依存关系来说明所开发技术的实际实现方式,裂纹长度位于电子束焊接制成的接头附近。

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