THE loT DEVICES IDENTIFICATION PROCEDURE BASED ON FORCED DEGRADING OF FLASH-MEMORY SECTOR

摘要

The paper presents the latest results of authors' scientific studies referred to large-scale research of the network and loT device identification methods. There has been considered the general concepts of hardware identification based on forced degrading of flash-memory sector. The results of experimental studies lead to formulating of several properties of degraded flash-memory chip and make possible to propose the method and application scenario of hardware identification based on forced flash-memory sector degrading.