首页> 外文期刊>Theoretical and Applied Genetics >Chromosomal location of a gene for resistance to septoria tritici blotch (Mycosphaerella graminicola)in the hexaploid wheat ’Synthetic 6x’
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Chromosomal location of a gene for resistance to septoria tritici blotch (Mycosphaerella graminicola)in the hexaploid wheat ’Synthetic 6x’

机译:六倍体小麦“ Synthetic 6x”中抗小麦纹枯病(Mycosphaerella graminicola)的基因的染色体位置

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Septoria tritici blotch, caused by the fungus Mycosphaerella graminicola,is currently the major foliar disease of wheat world-wide, and new sources of resistance and knowledge about the genetics of resistance are needed to improve breeding for resistance to this disease. Sears’s ’Synthetic 6x’ hexaploid wheat, derived from a hybrid of Triticum dicoccoides and Triticum tauschii, was resistant to 12 of 13 isolates of M. graminicola tested. Chromosome 7D of ’Synthetic 6x’ was identified as carrying resistance to all 12 isolates in tests of seedlings of inter-varietal chromosome substitution lines of ’Synthetic 6x’ into ’Chinese Spring’ and to two isolates in tests of adult plants. A septoria tritici blotch resistance gene, named Stb5, was identified using the M. graminicola isolate IPO94269 and mapped on the short arm of chromosome 7D, near the centromere, in a population of single homozygous chromosome-recombinant lines for the 7D chromosome.
机译:由真菌Mycosphaerella graminicola引起的小麦黑斑病是目前世界范围内小麦的主要叶面疾病,需要新的抗性来源和有关抗性遗传学的知识以改善对该疾病的抗性育种。 Sears的'Synthetic 6x'六倍体小麦是由Triticum dicoccoides和Triticum tauschii的杂种衍生而来,对测试的13种分离的M. graminicola具有抗性。 “合成6x”染色体7D在“合成6x”到“中国春”的种间染色体替代品系的幼苗测试中被鉴定为对所有12个分离株都有抗性,在成年植物测试中被鉴定为对两个分离株具有抗性。使用粒状分枝杆菌分离物IPO94269鉴定了一种名为Stb5的小麦败血症抗性基因,并将其定位在7D染色体单纯合染色体重组株群体中靠近着丝粒的7D染色体短臂上。

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