首页> 外文期刊>表面技術 >Distinction of Conductive PbO_2 and Non-conductive PbSO_4 in Deposited Mixtures on IrO_2-Ta_2O_5/Ti Anodes Using SEM with Low Accelerated Incident Electrons
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Distinction of Conductive PbO_2 and Non-conductive PbSO_4 in Deposited Mixtures on IrO_2-Ta_2O_5/Ti Anodes Using SEM with Low Accelerated Incident Electrons

机译:使用低加速入射电子的SEM区分IrO_2-Ta_2O_5 / Ti阳极上沉积混合物中的导电PbO_2和非导电PbSO_4

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SEM observation at a low accelerated electron beam such as at 1 keV successfully distinguished conductive PbO_2 from non-conductive PbSO_4 which are deposited as the mixture on the IrO_2-Ta_2O_5/Ti anode after the electrolysis in the acidic solution containing Pb (Ⅱ). Although brightness in SEM images is generally affected by shape and conductivity of the sample, the SEM images in this study were observed at the same area of the sample by changing the acceleration voltage of the electron beam. Therefore, SEM observation at 1 keV indicates that the depth of the electron beam more clearly reflects the difference in conductivity which is given as the difference in brightness. The SEM measurement technique shown in this study is helpful for the similar situation that the target for analysis is the mixture containing compounds that are difficult to distinguish by characteristic X-ray.
机译:在低加速电子束(例如1 keV)下的SEM观察成功地将导电PbO_2与非导电PbSO_4区别开来,后者是在含Pb(Ⅱ)的酸性溶液中电解后作为混合物沉积在IrO_2-Ta_2O_5 / Ti阳极上的。尽管SEM图像中的亮度通常受样品形状和电导率的影响,但通过更改电子束的加速电压,可以在样品的相同区域观察到本研究中的SEM图像。因此,在1keV下的SEM观察表明,电子束的深度更清楚地反映出电导率的差异,该差异被称为亮度差异。这项研究中显示的SEM测量技术对于类似的情况很有帮助,因为分析的目标是含有难以通过特征X射线区分的化合物的混合物。

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