Sulfur edge XANES and XPS spectroscopy of ethanethiol adsorbed on nickel

摘要

For the interaction of ethanethiol (C_2H_5SH) with the Ni(110) surface, we utilize X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. Upon adsorption on the Ni(110) surface, ethanethiolate as well as atomic sulfur is formed. For the ethanethiolate, the S-C bond is found predominantly perpendicular to the substrate as revealed by polarization analysis. A qualitative estimation of charge transfer from substrate to molecule is carried out with the aid of S 1s XPS measurements.