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首页> 外文期刊>Spectrum, IEEE >Instrumentation: Get to know op amps; use a curve tracer: For the out of the ordinary application, it is not surprising to find op amp spec sheets wanting
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Instrumentation: Get to know op amps; use a curve tracer: For the out of the ordinary application, it is not surprising to find op amp spec sheets wanting

机译:仪表:了解运算放大器;使用曲线跟踪器:对于非常规应用,找到想要的运放规格表并不奇怪

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摘要

Describes the application of a transistor curve tracer to measure operational amplifier characteristics, test, circuits and results are shown. Open loop gain, input offset, common mode rejection, power supply rejection, supply rejection, supply current/supply voltage, and noise measurement and curves are described.
机译:描述了晶体管曲线跟踪仪在测量运算放大器特性方面的应用,并显示了测试,电路和结果。描述了开环增益,输入失调,共模抑制,电源抑制,电源抑制,电源电流/电源电压以及噪声测量和曲线。

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