首页> 外文期刊>Spectrum, IEEE >Solid state: Fast electron-beam lithography: High blanking speeds may make this new system a serious challenger in producing submicrometer ICs
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Solid state: Fast electron-beam lithography: High blanking speeds may make this new system a serious challenger in producing submicrometer ICs

机译:固态:快速电子束光刻:高消隐速度可能使这一新系统成为生产亚微米IC的严峻挑战

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摘要

Electron-beam lithography may become competitive with optical methods for making integrated circuits. The step that could make this possible is an electron-beam lithography system developed at Hewlett-Packard that is potentially many times faster than previous machines for making ICs through direct writing on wafers or generating high-precision masks. The Hewlett-Packard system has a beam spot-corresponding to the smallest pixel that can be written-with a diameter that can be varied from 0.5 to 0.25 μm.
机译:电子束光刻技术可能与用于制造集成电路的光学方法竞争。使这一目标成为可能的步骤是由惠普公司开发的电子束光刻系统,其速度可能比以前通过直接在晶圆上直接写入或生成高精度掩模来制造IC的机器快许多倍。惠普系统具有对应于可以写入的最小像素的光束点,其直径可以在0.5到0.25μm之间变化。

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