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首页> 外文期刊>Solid-State Circuits, IEEE Journal of >0.5-V Low-$V _{rm T}$ CMOS Preamplifier for Low-Power and High-Speed Gigabit-DRAM Arrays
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0.5-V Low-$V _{rm T}$ CMOS Preamplifier for Low-Power and High-Speed Gigabit-DRAM Arrays

机译:适用于低功耗和高速千兆位DRAM阵列的0.5V Low- $ V _ {rm T} $ CMOS前置放大器

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摘要

A novel low-$V _{rm T}$ CMOS preamplifier was developed for low-power and high-speed gigabit DRAM arrays. The sensing time of a sense amplifier (SA) with the proposed preamplifier and its activation schemes at a data-line voltage of 0.5 V was 6 ns, which is 62% shorter than that of an SA using a conventional preamplifier. By activating the proposed preamplifier temporarily during the write cycle, the writing time was 16.3 ns, which is 72% shorter than the case without activation of the proposed preamplifier, and this time is short enough to apply a DRAM array using the proposed preamplifier to 1.6-Gbit/s/pin DDR3 SDRAM. The operating current of the memory array and its peripheral circuit including the proposed preamplifier was reduced by 12% by reducing the data-line voltage from 0.8 to 0.5 V.
机译:针对低功率和高速千兆位DRAM阵列,开发了一种新颖的低$ V_ {rm T} $ CMOS前置放大器。具有所提出的前置放大器及其激活方案的感测放大器(SA)在0.5 V数据线电压下的感测时间为6 ns,比使用传统前置放大器的SA的感测时间短62%。通过在写入周期中暂时激活建议的前置放大器,写入时间为16.3 ns,比未激活建议的前置放大器的情况要短72%,并且此时间足够短,可以将使用建议的前置放大器的DRAM阵列应用于1.6 -Gbit / s / pin DDR3 SDRAM。通过将数据线电压从0.8 V降低到0.5 V,存储器阵列及其外围电路(包括拟议的前置放大器)的工作电流降低了12%。

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