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首页> 外文期刊>Solid-State Circuits, IEEE Journal of >0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance
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0.77 fJ/bit/search Content Addressable Memory Using Small Match Line Swing and Automated Background Checking Scheme for Variation Tolerance

机译:0.77 fJ / bit /搜索内容的可寻址内存,使用小的匹配线摆动和自动背景检查方案以实现变化容差

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摘要

This work reports a fully parallel match-line (ML) structure with an automated background checking (ABC) scheme. MLs are pre-charged to an intermediate level by a pulsed current source to minimize power. The proposed ABC scheme uses two dummy rows for digitally adjusting the pulse width and the delay of the sense amplifier enable signals of the CAM without disturbing the normal operation. Therefore, it can continuously track the optimum ML swing, making the CAM tolerant to variations. The proposed ABC scheme achieves the power reduction of 5.5× compared with the conventional ML sensing scheme. In addition, multi-V t transistors are used in the CAM cell to reduce the leakage by 15× while improving the ML discharging speed by 2× when compared with the standard-V t devices at 1.2 V, 80 °C. A test chip was prototyped using a standard 65 nm CMOS process. The average energy consumption is 0.77 fJ/bit/search at 1.2 V/500 MHz.
机译:这项工作报告了具有自动背景检查(ABC)方案的完全并行的匹配线(ML)结构。 ML通过脉冲电流源预充电到中间水平,以最大程度地降低功率。所提出的ABC方案使用两个虚拟行来数字地调节脉冲宽度和CAM的感测放大器使能信号的延迟,而不会干扰正常操作。因此,它可以连续跟踪最佳的ML摆动,从而使CAM容忍变化。与传统的ML感应方案相比,提出的ABC方案可将功耗降低5.5倍。此外,与1.2 V,80°C的标准V t器件相比,在CAM单元中使用多V t晶体管可将泄漏减少15倍,同时将ML放电速度提高2倍。使用标准的65 nm CMOS工艺对测试芯片进行原型制作。在1.2 V / 500 MHz下,平均能耗为0.77 fJ /位/搜索。

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