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Evaluation of response characteristics of resistive oxygen sensors based on porous cerium oxide thick film using pressure modulation method

机译:基于压力调制法的多孔氧化铈厚膜电阻式氧气传感器响应特性评估

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In order to reduce the response time of resistive oxygen sensors using porous cerium oxide thick film, it is important to ascertain the factors controlling response. Pressure modulation method (PMM) was used to find the rate-limiting step of sensor response. This useful method measures the amplitude of sensor output (H(f)) for the sine wave modulation of oxygen partial pressure at constant frequency (f). In PMM, "break" response time, which is minimum period in which the sensor responds precisely, can be measured. Three points were examined:simulated calculations of PMM were carried out using a model of porous thick film in which spherical particles are connected in a three-dimensional network; sensor response speed was experimentally measured using PMM; and the diffusion coefficient and surface reaction coefficient were estimated by comparison between experiment and calculation. The plot of logf versus logH(f) in the high /region was found to have a slope of approximately —0.5 for both porous thick film and non-porous thin film, when the rate-limiting step was diffusion. Calculations showed the response time of porous thick film was 1/20 that of non-porous thin film when the grain diameter of the porous thick film was the same as the thickness of non-porous thin film. At 973 K, "break" response time (tb) of the resistive oxygen sensor was found by experiment to be 109 ms. It was concluded that the response of the resistive oxygen sensor prepared in this study was strongly controlled by diffusion at 923-1023 K, since the experiment revealed that the slope of plot of logf versus logH(f) in the high/region was approximately —0.5. At 923-1023 K, the diffusion coefficient of oxygen vacancy in porous ceria (Dv) was expressed as follows: Dv (m~2s~(-1)) = 5.78 x 10~(-4) exp(-1.94 eV/kT). At 1023 K, the surface reaction coefficient (K) was found to exceed 10~(-4) m/s.
机译:为了减少使用多孔氧化铈厚膜的电阻式氧传感器的响应时间,重要的是确定控制响应的因素。使用压力调制方法(PMM)来找到传感器响应的限速步骤。这种有用的方法可在恒定频率(f)下测量氧分压的正弦波调制的传感器输出(H(f))的幅度。在PMM中,可以测量“中断”响应时间,这是传感器精确响应的最短时间。检验了三点:使用多孔厚膜模型,其中球形颗粒连接在三维网络中,对PMM进行了模拟计算。使用PMM实验测量了传感器的响应速度;通过实验与计算的比较估算出扩散系数和表面反应系数。当限制速率的步骤是扩散时,对于多孔厚膜和无孔薄膜,在高/区域中的logf对logH(f)的曲线被发现具有大约-0.5的斜率。计算表明,当多孔厚膜的粒径与无孔薄膜的厚度相同时,多孔厚膜的响应时间是无孔薄膜的响应时间的1/20。通过实验发现,在973 K处,电阻式氧气传感器的“断开”响应时间(tb)为109 ms。结论是,该实验制备的电阻式氧气传感器的响应受到923-1023 K扩散的强烈控制,因为该实验表明在高/区域中logf与logH(f)的曲线的斜率近似为- 0.5。在923-1023 K下,多孔二氧化铈(Dv)中氧空位的扩散系数表示为:Dv(m〜2s〜(-1))= 5.78 x 10〜(-4)exp(-1.94 eV / kT )。发现在1023 K下,表面反应系数(K)超过10〜(-4)m / s。

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