RFID Improves

摘要

Aignificant driver of wafer final test throughput is the availability of the right probe card for a particular lot of wafers. In facilities with hundreds or thousands of probe cards, keeping track of where they are and ensuring they are available and ready for use when needed is a formidable challenge. When a card is misidentified and used on the wrong lot/product, throughput drops because of the need to retest the wafers. This article describes a methodology of tracking, validating and managing probe cards using the same radio frequency identification (RFID) technology that has become the de facto standard for wafer-lot validation. Estimated improvements in throughput, rework and data accuracy are also provided as a comparison to manual or semi-manual (barcode) methods.