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Quantification of total element concentrations in soils using total X-ray fluorescence spectroscopy (TXRF)

机译:使用总X射线荧光光谱法(TXRF)对土壤中的总元素浓度进行定量

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Total X-ray fluorescence spectroscopy (TXRF) determines concentrations of major and trace elements in multiple media. We developed and tested a method for the use of TXRF for direct quantification of total element concentrations in soils using an S2 PICOFOX™ spectrometer (Bruker AXS Microanalysis GmbH, Germany). We selected 15 contrasting soil samples from across sub-Saharan Africa for element analysis to calibrate the instrument against concentrations determined using the inductively coupled plasma-mass spectroscopy (ICP-MS) standard method. A consistent underestimation of element concentrations using TXRF compared to ICP-MS reference analysis occurred, indicating that spectrometer recalibration was required. Single-element recalibration improved the TXRF spectrometer's sensitivity curve. Subsequent analysis revealed that TXRF determined total element concentrations of Al, K, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, and Ga accurately (model efficacy/slope close to 1:1 line, and R~2 > 0.80) over a wide range of soil samples. Other elements that could be estimated with an acceptable precision (R~2 > 0.60) compared with ICP-MS although generally somewhat under- or overestimated were P, Ca, As, Rb, Sr, Y, Pr, Ta and Pb. Even after recalibration, compared to ICP-MS the TXRF spectrometer produced underestimations for elements Na, Mg, Ba, Ce, Hf, La, Nd, W and Sm and over-estimations for elements Bi, Tl and Zr. We validated the degree of accuracy of the TXRF analytical method after recalibration using an independent set of 20 soil samples. We also tested the accuracy of the analysis using 2 multi-element standards as well as the method repeatability on replicate samples. The resulting total element concentration repeatability for all elements analyzed were within 10% coefficient of variability after the instrument recalibration except for Cd and Tl. Our findings demonstrate that TXRF could be used as a rapid screening tool for total element concentrations in soils assuming that sufficient calibration measures are followed.
机译:总X射线荧光光谱(TXRF)确定多种介质中主要元素和痕量元素的浓度。我们开发并测试了一种使用S2 PICOFOX™光谱仪(德国布鲁克AXS Microanalysis GmbH)直接使用TXRF定量测定土壤中总元素浓度的方法。我们从整个撒哈拉以南非洲地区选择了15个对比土壤样品进行元素分析,以针对使用电感耦合等离子体质谱(ICP-MS)标准方法测定的浓度校准仪器。与ICP-MS参比分析相比,使用TXRF对元素浓度进行了一致的低估,表明需要对光谱仪进行重新校准。单元素重新校准改善了TXRF光谱仪的灵敏度曲线。随后的分析表明,TXRF可以准确测定Al,K,Ti,V,Cr,Mn,Fe,Ni,Cu,Zn和Ga的总元素浓度(模型功效/斜率接近1:1线,R〜2> 0.80)的土壤样品。与ICP-MS相比,其他可以估算的精度(R〜2> 0.60)的元素,尽管通常被低估或高估了,但其元素为P,Ca,As,Rb,Sr,Y,Pr,Ta和Pb。甚至在重新校准后,与ICP-MS相比,TXRF光谱仪也会低估Na,Mg,Ba,Ce,Hf,La,Nd,W和Sm元素,而高估Bi,Tl和Zr元素。我们使用一组独立的20个土壤样品重新校准后,验证了TXRF分析方法的准确性。我们还使用2种多元素标准品测试了分析的准确性以及方法在重复样品上的可重复性。仪器重新校准后,除Cd和Tl外,所有分析元素的总元素浓度重复性均在变异系数的10%以内。我们的研究结果表明,只要采取了充分的校准措施,TXRF可用作土壤中总元素浓度的快速筛选工具。

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