...
首页> 外文期刊>Science, Measurement & Technology, IET >Space charge and conductivity measurement of XLPE nanocomposites for HVDC insulation–permittivity as a nanofiller selection parameter
【24h】

Space charge and conductivity measurement of XLPE nanocomposites for HVDC insulation–permittivity as a nanofiller selection parameter

机译:用于HVDC绝缘的XLPE纳米复合材料的空间电荷和电导率测量-介电常数作为纳米填料的选择参数

获取原文
获取原文并翻译 | 示例
           

摘要

Cross-linked polyethylene (XLPE) insulation is successfully used for high-voltage AC transmission. However, it is still under development for high-voltage DC application due to space charge accumulation, which distorts the internal electrical field distribution and leads to its aging/failure. Therefore, the space charge should be measured and carefully analysed. On the other side, conductivity measurement helps to forecast the degradation probability of the insulation. Higher conductivity represents the severe degradation. Nanofiller addition, such as SiO2, TiO2, MgO and so on (<;5 wt%), particularly surface-modified nanofiller due to its better dispersion significantly suppresses the space charge accumulation and conductivity. Nevertheless, the choice of suitable nanofiller has still remained a challenge. With this context, space charge and conductivity of XLPE-silica and XLPE-magnesium oxide (MgO) surface-modified nanocomposites are measured. This study proposes a parameter for nanofiller selection that will deliver optimal properties for the intended application. Results show that nanocomposites with higher nanofiller permittivity (i.e. MgO) have less space charge accumulation and low conductivity and are justified with the help of a band gap theory model.
机译:交联聚乙烯(XLPE)绝缘体已成功用于高压交流输电。但是,由于空间电荷的积累,它会使内部电场分布失真并导致其老化/失效,因此仍在开发高压DC应用。因此,应测量并仔细分析空间电荷。另一方面,电导率测量有助于预测绝缘材料的退化可能性。较高的电导率表示严重降解。纳米填料,例如SiO n 2 n,TiO n 2、MgO等(<; 5 wt%),尤其是表面改性的纳米填料,因为其更好的分散性显着抑制了空间电荷积累和导电性。然而,选择合适的纳米填料仍然是一个挑战。在这种情况下,测量了XLPE二氧化硅和XLPE氧化镁(MgO)表面改性的纳米复合材料的空间电荷和电导率。这项研究为纳米填料的选择提出了一个参数,该参数将为预期的应用提供最佳性能。结果表明,具有较高纳米填料介电常数(即MgO)的纳米复合材料具有较少的空间电荷积累和较低的电导率,并且借助带隙理论模型是合理的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号