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Automated test generation for IEC 61131-3 ST programs via dynamic symbolic execution

机译:通过动态符号执行,IEC 61131-3 ST程序自动测试生成

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摘要

Programmable logic controllers (PLCs) are essentially domain-specific computers that are widely used in the industrial field. These industrial devices are usually required to be of high reliability, and program bugs can lead to catastrophes. However, there are few automated testing tools for PLC programs. This paper proposes a framework, named STAu-toTester, for automatically generating test cases for IEC 61131-3 Structured Text (ST) programs. It adopts Dynamic Symbol Execution (DSE) combined with redundant path pruning to efficiently perform PLC multi-cycle test data generation under different coverage criteria. We have evaluated STAutoTester on 21 programs. The experimental results show that STAutoTester can effectively handle these programs. Compared to S_(YM)PLC, a previous symbolic execution based tool for automatically testing PLC software, we achieved comparable statement coverage with much fewer test cases. Besides, we have achieved greater branch coverage and stricter MC/DC coverage, which were not implemented by S_(YM)PLC.
机译:可编程逻辑控制器(PLC)基本上是特定于域的计算机,这些计算机被广泛用于工业领域。这些工业设备通常需要具有高可靠性,并且程序错误可能导致灾难。但是,PLC程序仍有很少的自动化测试工具。本文提出了一个名为STAU-TOTERST的框架,用于自动生成IEC 61131-3结构化文本(ST)程序的测试用例。它采用动态符号执行(DSE)与冗余路径修剪组合,以便在不同的覆盖标准下有效地执行PLC多循环测试数据生成。我们在21个计划上评估了Stautotester。实验结果表明,Stautotester可以有效处理这些程序。与S_(YM)PLC相比,以前的符号执行基于符号执行用于自动测试PLC软件,我们实现了相当的语句覆盖范围,测试用例更少。此外,我们已经实现了更大的分支覆盖率和更严格的MC / DC覆盖率,该覆盖率不受S_(YM)PLC实现。

著录项

  • 来源
    《Science of Computer Programming》 |2021年第1期|102608.1-102608.12|共12页
  • 作者单位

    National Trusted Embedded Software Engineering Technology Research Center East China Normal University Shanghai China;

    National Trusted Embedded Software Engineering Technology Research Center East China Normal University Shanghai China Hardware/Software Co-Design Technology and Application Engineering Research Center East China Normal University Shanghai China;

    Shanghai Key Laboratory of Trustworthy Computing East China Normal University Shanghai China;

    National Trusted Embedded Software Engineering Technology Research Center East China Normal University Shanghai China;

    National Trusted Embedded Software Engineering Technology Research Center East China Normal University Shanghai China;

    National Trusted Embedded Software Engineering Technology Research Center East China Normal University Shanghai China Shanghai Key Laboratory of Trustworthy Computing East China Normal University Shanghai China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Test generation; IEC 61131-3 ST; Dynamic symbol execution;

    机译:试验;IEC 61131-3 ST;动态符号执行;
  • 入库时间 2022-08-19 01:59:43

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