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Method to obtain absolute impurity density profiles combining charge exchange and beam emission spectroscopy without absolute intensity calibration

机译:无需绝对强度校准即可结合电荷交换和束发射光谱获得绝对杂质密度分布的方法

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Investigation of impurity transport properties in tokamak plasmas is essential and a diagnostic that can provide information on the impurity content is required. Combining charge exchange recombination spectroscopy (CXRS) and beam emission spectroscopy (BES), absolute radial profiles of impurity densities can be obtained from the CXRS and BES intensities, electron density and CXRS and BES emission rates, without requiring any absolute calibration of the spectra. The technique is demonstrated here with absolute impurity density radial profiles obtained in TEXTOR plasmas, using a high efficiency charge exchange spectrometer with high etendue, that measures the CXRS and BES spectra along the same lines-of-sight, offering an additional advantage for the determination of absolute impurity densities.
机译:托卡马克等离子体中杂质传输特性的研究至关重要,因此需要能够提供有关杂质含量信息的诊断方法。结合电荷交换复合光谱学(CXRS)和束发射光谱学(BES),可以从CXRS和BES强度,电子密度以及CXRS和BES发射速率获得杂质密度的绝对径向分布,而无需对光谱进行任何绝对校准。在此,使用具有高扩展量的高效电荷交换光谱仪,在TEXTOR等离子体中获得的绝对杂质密度径向分布图上演示了该技术,该光谱仪沿相同的视线测量CXRS和BES光谱,为测定提供了额外的优势绝对杂质密度。

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