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Space-resolved extreme ultraviolet spectrometer for impurity emission profile measurement in Large Helical Device

机译:用于大型螺旋装置中杂质发射轮廓测量的空间分辨极紫外光谱仪

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摘要

A space-resolved extreme ultraviolet (EUV) spectrometer working in 60–400 Å range has been developed to observe impurity emission profiles in core and edge plasmas of Large Helical Device (LHD). A flat focus is made for plane surface detector by using a varied line spacing holographic grating with an angle of incidence of 87°. An excellent spectral resolution of 0.22 Å at 200 Å is then obtained after careful adjustment of the optical components. In the profile measurement of the LHD plasmas, the toroidal resolution is important as well as the radial resolution because the magnetic surfaces of LHD quickly change when the observation chord is tilted at a slightly different toroidal location. Horizontal dispersion is therefore selected for the present spectrometer. As a result, the toroidal resolution of 75 mm is achieved at the plasma position. An enough radial resolution of 10 mm is also obtained at spatial-resolution slit width of 0.2 mm. In order to measure the full radial profile of LHD plasmas the spectrometer is placed at a distance of ∼ 9200 mm away from the plasma center and a backilluminated charge-coupled device with a size of 6.6×26.6 mm2 is set vertical to the horizontal dispersion. Half of the LHD plasma, i.e., ∼ 50 cm, can be measured along the vertical direction at horizontally elongated plasma cross section. A full vertical profile can be obtained by changing the vertical angle of the EUV spectrometer. As an example the full vertical profile of edge C IV (312.4 Å) emission is presented. A wavelength interval of 35–65 Å can be simultaneously observed, which varies according to the wavelength to be measured. A local emission profile of Fe XX (132.67 Å) is also presented after Abel inversion as a typical example of the core EUV emission. Finally, the EUV spectrometer is absolutely calibrated using EUV bremsstrahlung continuum profile in comparison with absolute values of visible bremsstrahlung continuum profile because the bremsstrahlung continuum can be easily detected in high-density discharges of LHD. © 2010 American Institute of Physics Article Outline INTRODUCTION DETAILS OF SPACE-RESOLVED EUV SPECTROMETER PERFORMANCE OF SPACE-RESOLVED EUV SPECTROMETER Spectral resolution Spatial resolution Toroidal resolution OPERATION OF CCD DETECTOR VERTICAL PROFILES OF EUV EMISSIONS Profile examples of EUV spectra in LHD Analysis of EUV emission profiles SUMMARY
机译:已经开发了一种工作在60-400Å范围内的空间分辨极紫外(EUV)光谱仪,以观察大型螺旋装置(LHD)的核心和边缘等离子体中的杂质发射曲线。通过使用入射角为87°的变化的行距全息光栅,为平面检测器创建了平焦点。在仔细调整光学组件之后,在200Å下可获得0.22Å的出色光谱分辨率。在LHD等离子体的轮廓测量中,环形分辨率和径向分辨率都很重要,因为当观察弦在稍微不同的环形位置倾斜时,LHD的磁性表面会快速变化。因此,本光谱仪选择了水平色散。结果,在等离子体位置处实现了75 mm的环形分辨率。在空间分辨率的缝隙宽度为0.2 mm时,也可以获得10 mm的足够的径向分辨率。为了测量LHD等离子体的整个径向轮廓,将光谱仪放置在距等离子体中心约9200 mm的距离处,并将尺寸为6.6×26.6 mm2的背照式电荷耦合器件垂直设置为水平分散。 LHD等离子体的一半,即约50 cm,可以在水平方向延长的等离子体横截面上沿垂直方向测量。可以通过更改EUV光谱仪的垂直角度来获得完整的垂直轮廓。作为示例,介绍了边缘C IV(312.4Å)发射的完整垂直轮廓。可以同时观察到35–65Å的波长间隔,该间隔根据要测量的波长而变化。作为核心EUV排放的典型示例,在进行了Abel反演之后,还给出了Fe XX(132.67Å)的局部排放曲线。最后,与可见的致辐射连续谱轮廓的绝对值相比,使用EUV stra致辐射连续谱绝对校准了EUV光谱仪,因为在LHD的高密度放电中很容易检测到bre致辐射连续谱。 ©2010美国物理研究所文章大纲太空分辨的EUV光谱仪的性能介绍太空分辨的EUV光谱仪的性能光谱分辨率空间分辨率环形分辨率CCD探测器的垂直分布EUV发射的垂直轮廓EUV光谱的轮廓示例在LHD分析中的EUV光谱轮廓摘要

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