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首页> 外文期刊>Review of Scientific Instruments >Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera
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Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

机译:用X射线针孔照相机确定ReA电子束陷阱的电子束半径和电流密度

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摘要

The Electron Beam Ion Trap (EBIT) of the National Superconducting Cyclotron Laboratory at Michigan State University is used as a charge booster and injector for the currently commissioned rare isotope re-accelerator facility ReA. This EBIT charge breeder is equipped with a unique superconducting magnet configuration, a combination of a solenoid and a pair of Helmholtz coils, allowing for a direct observation of the ion cloud while maintaining the advantages of a long ion trapping region. The current density of its electron beam is a key factor for efficient capture and fast charge breeding of continuously injected, short-lived isotope beams. It depends on the radius of the magnetically compressed electron beam. This radius is measured by imaging the highly charged ion cloud trapped within the electron beam with a pinhole camera, which is sensitive to X-rays emitted by the ions with photon energies between 2 keV and 10 keV. The 80%-radius of a cylindrical 800 mA electron beam with an energy of 15 keV is determined to be r80%=(212±19)μm in a 4 T magnetic field. From this, a current density of j = (454 ± 83)A/cm2 is derived. These results are in good agreement with electron beam trajectory simulations performed with TriComp and serve as a test for future electron gun design developments.
机译:密歇根州立大学国家超导回旋加速器实验室的电子束离子阱(EBIT)被用作目前已启用的稀有同位素再加速器设施ReA的电荷增强器和喷射器。该EBIT电荷繁殖器配备独特的超导磁体配置,螺线管和一对亥姆霍兹线圈的组合,可以直接观察离子云,同时保持长离子捕获区的优势。电子束的电流密度是有效捕获和快速注入连续注入的短寿命同位素束的关键因素。它取决于磁压缩电子束的半径。通过使用针孔照相机对电子束中捕获的高电荷离子云进行成像来测量该半径,该针孔照相机对离子在2 keV和10 keV之间的光子能量所发射的X射线敏感。在4 T磁场中,能量为15 keV的圆柱形800 mA电子束的80%半径确定为r80%=(212±19)μm。由此得出的电流密度为j =(454±83)A / cm 2 。这些结果与TriComp进行的电子束轨迹模拟非常吻合,并且可以作为未来电子枪设计开发的测试。

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