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A comparative study of ionospheric total electron content measurements using global ionospheric maps of GPS, TOPEX radar, and the Bent model

机译:使用GPS,TOPEX雷达和Bent模型的全球电离层图测量电离层总电子含量的比较研究

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Global ionospheric mapping (GIM) is a new and emerging technique for determining global ionospheric TEC (total electron content) based on measurements from a worldwide network of Global Positioning System (GPS) receivers. In this study, GIM accuracy in specifying TEC is investigated by comparison with direct ionospheric measurements from the TOPEX altimeter. A climatological model (Bent model) is also used to compare with the TOPEX altimeter data. We find that the GIM technique has much better agreement with TOPEX in TEC measurements, compared with the predictions of the climatological model. The difference between GIM and TOPEX in TEC measurements is very small (less than 1.5 TEC units (TECU)) within a 1500-km range from a reference GPS station. The RMS gradually increases with increasing distance from the station, while the Bent model shows a constant large RMS, unrelated to any station location. Within a 1000-km distance of a GPS site (elevation angle > 25°), GIM has a good correlation (R > 0.93) to TOPEX with respect to TEC measurements. The slope of the linear fitting line to the data set from two TOPEX cycles is 44.5° (near the ideal 45°). In the northern hemispheric regions, ionospheric specification by GIM appears to be accurate to within 3–10 TECU up to 2000+ km away from nearest GPS station (corresponding to ∼1° elevation angle cutoff). Beyond 2000 km, GIM accuracy, on average, is reduced to the Bent model levels. In the equatorial region, the Bent model predictions are systematically lower (∼5.0 TECU) than TOPEX values and often show a saturation at large TEC values. During ionospheric disturbed periods, GIM sometimes shows differences from TOPEX values due to transient variations of the ionosphere. Such problems may be improved by the continuous addition of new GPS stations in data-sparse regions. Thus, over a GPS station's measurement realm (up to 2000 km in radius), GIM can produce generally accurate TEC values. Through a spatial and temporal extrapolation of GPS-derived TEC measurements, the GIM technique provides a powerful tool for monitoring global ionospheric features in near real time.
机译:全球电离层测绘(GIM)是一项新技术,用于根据全球定位系统(GPS)接收器全球网络的测量结果确定全球电离层TEC(总电子含量)。在这项研究中,通过与TOPEX高度计的直接电离层测量结果进行比较,研究了GIM在指定TEC中的准确性。气候模型(Bent模型)也用于与TOPEX高度计数据进行比较。我们发现,与气候模型的预测相比,GIM技术与TOPEX在TEC测量中具有更好的一致性。在距参考GPS站1500公里的范围内,TEC测量中GIM和TOPEX之间的差异非常小(小于1.5 TEC单位(TECU))。 RMS随距测站距离的增加而逐渐增加,而Bent模型显示出恒定的大RMS,与任何测站位置无关。在距GPS站点1000公里的距离内(仰角> 25°),就TEC测量而言,GIM与TOPEX具有良好的相关性(R> 0.93)。线性拟合线相对于两个TOPEX周期的数据集的斜率为44.5°(接近理想45°)。在北半球区域,GIM的电离层规范似乎准确到距最近的GPS站2000+ km为止的3-10 TECU以内(对应于约1°仰角截止)。超过2000 km,平均GIM精度会降低到Bent模型级别。在赤道地区,Bent模型的预测值总体上低于TOPEX值(〜5.0 TECU),并且通常在大TEC值时显示饱和。在电离层扰动期间,由于电离层的瞬时变化,GIM有时会显示与TOPEX值的差异。通过在数据稀疏区域中连续添加新的GPS站,可以改善此类问题。因此,在GPS站的测量范围(半径最大为2000 km)上,GIM可以生成通常准确的TEC值。通过对GPS产生的TEC测量值进行时空外推,GIM技术提供了一个强大的工具,可以近实时地监测全球电离层特征。

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