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An evaluation of a new two-dimensional analytic ionospheric ray-tracing technique: Segmented method for analytic ray tracing (SMART)

机译:一种新的二维分析电离层射线追踪技术的评估:分段分析射线追踪方法(SMART)

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摘要

Analytic ray tracing is considerably less time consuming than numerical ray tracing. However, despite the advantage of speed, analytic ray tracing has a major limitation: the difficulty of including the effects on the ray path of horizontal gradients in electron density. In the past this difficulty has been addressed using ionospheric models whereby an effective tilt is introduced by displacing the center of the ionosphere from the center of the Earth. In this paper, ray equations for the ground range, phase path, group path, and divergent power loss are developed for a new two-dimensional analytic ray tracing technique, known as the segmented method for analytic ray tracing (SMART), which is able to deal with horizontal gradients in electron density. Ray tracing using two tilting methods are compared with ray tracing using SMART. Further, these results are compared with a numerical ray tracing program known as homing-in ray tracing (HIRT).
机译:分析射线跟踪比数字射线跟踪耗时少得多。然而,尽管具有速度优势,但分析射线追踪仍存在主要局限性:难以将电子密度的水平梯度对射线路径的影响包括在内。过去,已经使用电离层模型解决了这一难题,该方法是通过将电离层的中心与地球中心相移来引入有效的倾斜度。在本文中,针对一种新的二维分析射线跟踪技术,开发了一种用于地面范围,相路径,组路径和发散功率损耗的射线方程,该方法被称为分析射线跟踪的分段方法(SMART),该方法能够处理电子密度的水平梯度。将使用两种倾斜方法的光线跟踪与使用SMART的光线跟踪进行比较。此外,将这些结果与称为归位射线跟踪(HIRT)的数字射线跟踪程序进行了比较。

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