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A f-chart for Monitoring Multi-variety and Small Batch Production Run

机译:监控多品种和小批量生产运行的f图

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摘要

Statistical process control is an important tool to monitor and control a process. It is used to ensure that the manufacturing process operates in the in-control state. Multi-variety and small batch production runs are common in manufacturing environments like flexible manufacturing systems and Just-in-Time systems, which are characterized by a wide variety of mixed products with small volume for each kind of production. It is difficult to apply traditional control charts efficiently and effectively in such environments. The method that control charts are plotted for each individual part is not proper, since the successive state of the manufacturing process cannot be reflected. In this paper, a proper f-chart is proposed for implementation in multi-variety and small batch production runs to monitor the process mean, and its statistical properties are evaluated. The run length distribution of the proposed f-chart has been obtained by modelling the multi-variety process. The ARL performance for various shifts, number of product types, and subgroup sizes has also been obtained. The results show that the f-chart can be successfully implemented to monitor a multi-variety production run. Finally, illustrative examples show that the proposed f-chart is effective in multi-variety and small batch manufacturing environment.
机译:统计过程控制是监视和控制过程的重要工具。它用于确保制造过程在控制状态下运行。多品种和小批量生产运行在诸如柔性制造系统和即时生产系统之类的制造环境中很常见,其特点是各种各样的混合产品,每种产品的生产量小。在这样的环境中,很难有效地应用传统的控制图。为每个单独的零件绘制控制图的方法是不合适的,因为无法反映制造过程的连续状态。本文提出了一种适合在多品种和小批量生产运行中实施的f图,以监控过程平均值,并评估其统计特性。拟议的f图的游程长度分布已通过对多品种过程进行建模获得。还获得了各种班次,产品类型数量和子组大小的ARL性能。结果表明,可以成功实施f图,以监视多品种生产运行。最后,说明性示例表明,所提出的f图在多品种和小批量制造环境中是有效的。

著录项

  • 来源
  • 作者单位

    National Key Laboratory of Fundamental Science for Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, 710071, China;

    National Key Laboratory of Fundamental Science for Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, 710071, China;

    National Key Laboratory of Fundamental Science for Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, 710071, China;

    National Key Laboratory of Fundamental Science for Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, 710071, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    control chart; multi-variety; small batch; f-distribution; statistical process control;

    机译:控制图多品种小批量f分布统计过程控制;

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