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"3D ICs with Self-Healing Capability for Thermal Effects in RF Circuits" Authors: Abhilash Goyal, Madhavan Swamina-than, Ph.D. and Abhijit Chatterjee, Ph.D.; Abstract: A self-healing methodology is proposed for designing 3D ICs with self-correctable circuits/ systems for heating effects. This methodology enables 3D ICs to work properly without designing/introducing sophisticated heat-removing capabilities around 3D ICs. The proposed methodology is independent of the kind of the circuit and process node technologies (CMOS or BJT). In the proposed methodology, temperature or heat around the circuit is monitored using an on-chip sensor. After sensing heat, the circuit is calibrated in the right direction to avoid performance degradation due to heating effects. The algorithm to calibrate the circuit is explained and, in addition, a very simple on-chip sensor presented to achieve the self-healing for heating effects. (15th International Symposium on Quality Electronic Design, March 2014).
机译:“具有自修复功能的3D IC,可在RF电路中产生热效应”作者:Abhilash Goyal,Madhavan Swamina-than博士。和Abhijit Chatterjee博士;摘要:提出了一种自修复方法,用于设计具有可自校正电路/系统的3D IC以产生热效应。这种方法使3D IC能够正常工作,而无需围绕3D IC设计/引入复杂的散热功能。所提出的方法与电路和工艺节点技术(CMOS或BJT)的种类无关。在建议的方法中,使用片上传感器监控电路周围的温度或热量。在感测到热量之后,电路将在正确的方向上进行校准,以避免由于发热效应而导致性能下降。解释了校准电路的算法,此外,还介绍了一种非常简单的片上传感器,以实现加热效应的自修复。 (第15届国际质量电子设计研讨会,2014年3月)。

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