【24h】

In Case You Missed It

机译:以防你错过了它

获取原文
获取原文并翻译 | 示例
       

摘要

"Evaluation of QFN Technology with Optically Inspectable Solder Connections" Authors: Dwight Daniels, Andrew Mawer, Paul Galles and W.H. Chan; dwight.daniels@nxp.com. Abstract: In quad flat no-lead (QFN) package assembly, QFNs have always been molded on multi-up (matrix) leadframes. For QFNs where each individual unit has its own mold cavity, a punching process is typically used to singulate units from the leadframe. For QFNs where multiple units are molded in a single cavity, a saw process is used to singulate individual units. Both processes can result in leadframe bare copper on the exterior perimeter of the part being exposed. One of the perceived disadvantages of QFN had been that on packages with this exposed copper, which generally gets oxidized prior to SMT reflow, it does not consistently wet with solder in typical SMT processes. Lack of a QFN side fillet means only the joints under the package are inspectable by x-ray, similar to BGAs. However, BGAs do not rely as much as QFNs on a very consistent solder paste printing process, since most of the volume of a BGA solder joint is supplied by the volume of BGA sphere. The authors review leadframe and package manufacturing processes to potentially make solderable the portion of the leadframe exposed on the side of the package. This can lead to consistent solder joint fillet formation on the side of the QFN package that is easily inspectable, including with AOI. The two most common ways to achieve at least a partially wettable lead on the sides of the QFN are the use of "dimpled" leadframes, or by step-cutting the package so that part of the edge of the lead gets electroplated with Sn. QFNs that promote the formation of side fillets are referred to as QFNs with "inspectable joints" or "wettable flanks." This paper presents a case study on step-cut QFNs that are able to form these optically inspectable joints. PCB footprint design, stencil design, SMT processes, inspection data, along with reliability data, are discussed. (SMTA International, September 2017)
机译:“通过光学可检查的焊点连接对QFN技术的评估”作者:Dwight Daniels,Andrew Mawer,Paul Galles和W.H.。 ; dwight.daniels@nxp.com。摘要:在四方扁平无引线(QFN)封装中,QFN总是模制在多层(矩阵)引线框架上。对于每个单独的单元都有自己的模腔的QFN,通常使用冲压工艺将引线框中的单元分离出来。对于在单个腔中模制多个单元的QFN,使用锯切工艺将单个单元分离。这两个过程都可能导致引线框架裸铜暴露在零件的外周边上。 QFN的一个公认缺点是,在带有裸露铜的封装上,通常在SMT回流之前将其氧化,在典型的SMT工艺中,铜并不能始终被焊料润湿。缺少QFN侧面圆角意味着与BGA相似,只能通过X射线检查封装下方的接头。但是,BGA不像QFN那样依赖非常一致的焊膏印刷工​​艺,因为BGA焊点的大部分体积是由BGA球体的体积提供的。作者回顾了引线框架和封装制造工艺,以潜在地使引线框架暴露在封装侧面的部分可焊接。这会导致在QFN封装的侧面形成一致的焊点角,这很容易检查,包括AOI。在QFN的侧面获得至少部分可润湿的引线的两种最常见的方法是使用“凹痕”引线框架,或者通过分步切割封装使引线边缘的一部分电镀锡。促进侧面圆角形成的QFN称为具有“可检查的接头”或“可润湿的侧面”的QFN。本文介绍了能够形成这些光学检查接头的阶梯式QFN的案例研究。讨论了PCB占位设计,模板设计,SMT工艺,检查数据以及可靠性数据。 (SMTA International,2017年9月)

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号