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摘要

This paper presents a case study on manufacturing test time optimization using a DMAIC (Define, Measure, Analyze, Improve and Control) approach. Leveraging good manufacturing first-pass yield, functional test simplification and redundant functional test elimination reduced end-to-end functional test time more than 50%. Statistical analysis and Six Sigma first-pass yield monitoring for six months after implementing the new test plan and test profile confirmed manufacturing test time optimization helped increase production output approximately 25% without compromising product quality. In correlation to the manufacturing test time optimization achieved was a significant cost-savings, estimated at more than $250,000 per annum. The case study demonstrated DMAIC as a structured tool that can be effective for manufacturing process improvement. (South East Asia Conference on Electronics Assembly, August 2018).