Impact of device technology on cosmic ray failures in power modules

摘要

More than 20 years ago, the phenomenon of cosmic ray induced failures in power electronic devices was first reported. High energy particles can generate `single event burnout' failures in power devices in blocking state, i.e. the device loses its blocking capability without any precursor on a nanosecond time scale. Whilst the root cause of the failure can rarely be identified after an explosion of the inverter, the statistical probability of cosmic ray failures can be determined from experiment, so that this random failure rate can be well predicted for power electronic systems. The considerable impact of device architecture will be demonstrated by experimental results for freewheeling diodes, showing that the CAL diode is very robust with regard to cosmic ray failures.