Using shifts in the electronic curve to evaluate polymer surface degradation

摘要

The polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy elec- tron beam were analyzed using a new method that consists in measuring the second crossover energy shift in the electronic emission curve. Upon prolonged irradiation, the second crossover energy shifts irreversibly to lower values in Teflon FET but to higher values in Mylar C, indicating distinct mechanisms of surface degradation for the two polymers.