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首页> 外文期刊>IEEE Transactions on Plasma Science >Novel Closing Switches Based on Propagation of Fast Ionization Fronts in Semiconductors
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Novel Closing Switches Based on Propagation of Fast Ionization Fronts in Semiconductors

机译:基于半导体中快速电离前沿传播的新型闭合开关

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Power kilovolt electric pulses with subnanosecond rise time can be formed by means of semiconductor switches based on the propagation of ionization fronts in Si structures. We describe a new generation of such devices—which are deep-level dynistors (DLDs). The triggering of the ionization front in the DLDs occurs due to the field-enhanced ionization of deep-level electron traps. The DLDs are able to form high-current pulses with subnanosecond rise time and low residual voltage just after switching. We describe two power generators based on the DLDs as examples. In addition, we discuss the possibility of picosecond switching based on tunneling-assisted impact-ionization fronts.
机译:具有亚纳秒上升时间的功率千伏电脉冲可以通过半导体开关基于Si结构中电离前沿的传播来形成。我们描述了新一代的此类设备-深层测向器(DLD)。 DLD中电离前沿的触发是由于深层电子陷阱的场增强电离而发生的。刚切换后,DLD能够形成具有亚纳秒上升时间和低残留电压的高电流脉冲。我们以DLD为例描述两个发电机。此外,我们讨论了基于隧道辅助的碰撞电离前沿的皮秒切换的可能性。

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