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Nanosecond Snapshots of High-Power Microwave Discharge in Waveguides

机译:波导中高功率微波放电的纳秒快照

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摘要

Using the same bend waveguide with two different E-field polarization directions, the breakdown phenomena in a curved waveguide with different power capacities were studied. For the case of lower power capacity, breakdown happens at the curved arm; with increasing incident power, the reflected peak amplitude increases, the breakdown delay time becomes shorter, and the reflected pulse gradually overlaps with the incident one, forming a slower falling edge at the end of incident pulse. For the case of higher power capacity, discharge may occur at the connected flanges without the choke shot. Using the four-frame intensified-charged-coupled device diagnosing the nanosecond light emission in each of the vertical and horizontal polarization cases, the intensities in both of the surface layer and the space beyond were found to first become bright during the microwave pulse, and then get dark after the pulse. The multiple bright spots on the wall illustrate the nonuniform plasma development and local high-density plasma at the microprotrusions with field enhancement, triggering the intense high-field emission or explosive emission.
机译:使用具有两个不同电场极化方向的同一弯曲波导,研究了具有不同功率容量的弯曲波导的击穿现象。如果功率容量较低,则在曲臂处发生击穿。随着入射功率的增加,反射峰值幅度增加,击穿延迟时间变短,反射脉冲逐渐与入射脉冲重叠,从而在入射脉冲结束时形成较慢的下降沿。对于更高的功率容量,在连接的法兰上可能会发生放电而没有扼流圈。使用四帧增强电荷耦合器件诊断垂直和水平极化情况下的纳秒级发光,发现在微波脉冲期间,表面层和其周围空间的强度首先变亮,并且然后在脉冲后变黑。墙上的多个亮点说明了微突起的不均匀等离子体发展和局部高密度等离子体的场增强,触发了强烈的高场发射或爆炸发射。

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