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Hard silicon carbonitride thin‐film coatings by remote hydrogen plasma chemical vapor deposition using aminosilane and silazane precursors. 2: Physical, optical,and mechanical properties of deposited films

机译:用氨基硅烷和硅氮烷前体远程氢等离子体化学气相沉积硬硅碳氮化型薄膜涂层。 2:沉积薄膜的物理,光学和机械性能

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摘要

Physical, optical, and mechanical properties of silicon carbonitride (a-SiCN) films produced by remote hydrogen plasma chemical vapor deposition (RP-CVD) using aminosilane and disilazane precursors are examined in relation to their chemical structure. The films deposited at different temperatures (30-400 degrees C) were characterized in terms of their density, refractive index, optical bandgap, photoluminescence, adhesion to a substrate, hardness, elastic modulus resistance to wear (predicted from the "plasticity index" values), and friction coefficient. Reasonable structural dependencies of film properties were determined using the relative integrated intensities of the infrared absorption bands from the Si-N and Si-C bonds, and the X-ray photoelectron spectroscopy Si2p band from the Si-C bonds (controlled by substrate temperature) evaluated in the first part of this study. In view of their good mechanical properties, a-SiCN films seem to be useful coatings for improving surface mechanics of engineering materials for advanced technology.
机译:通过远程氢等离子体化学气相沉积(RP-CVD)使用氨基硅烷和二硅烷前体产生的碳碳氮化物(A-SICN)膜的物理,光学和机械性能被研究与其化学结构相关。在不同温度(30-400℃)的薄膜的特征在于它们的密度,折射率,光学带隙,光致发光,与基板的粘附性,硬度,弹性模量耐磨损(从“可塑性指数”值预测) )和摩擦系数。使用来自Si-N和Si-C键的红外吸收带的相对综合强度和来自Si-C键的X射线光电子光谱Si2P带(由衬底温度控制)测定薄膜性能的合理结构依赖性。在本研究的第一部分评估。鉴于其良好的机械性能,A-SICN薄膜似乎是改善先进技术的工程材料表面力学的有用涂料。

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