首页> 外文期刊>Physical review >Indications of surface-dominated transport in single crystalline nanoflake devices of topological insulator Bi_(1.5)Sb_(0.5)Te_(1.8)Se_(1.2)
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Indications of surface-dominated transport in single crystalline nanoflake devices of topological insulator Bi_(1.5)Sb_(0.5)Te_(1.8)Se_(1.2)

机译:拓扑绝缘体Bi_(1.5)Sb_(0.5)Te_(1.8)Se_(1.2)的单晶纳米薄片器件中以表面为主的传输的指示

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摘要

We report experimental evidence of surface-dominated transport in single crystalline nanoflake devices of topological insulator Bi_(1.5)Sb_(0.5)Te_(1.8)Se_(1.2)(BSTS). The resistivity measurements show dramatic differences between the nanoflake devices and bulk single crystal. Based on a two-channel model, the analysis on the resistivity and Hall resistance indicates that ~99% surface transport contribution can be realized in 200 nm-thick BSTS nanoflake devices. Using a standard back gate with SiO_2 as a dielectric layer, a pronounced ambipolar electric field effect was observed in devices fabricated with 100-200 nm thick flakes. Moreover, angle-dependent magnetoresistances of a nanoflake device with a thickness of 596 nanometers are fitted to a universal curve for the perpendicular component of the applied magnetic field. The value of phase coherence length obtained from two-dimensional weak antilocalization fitting further confirmed the surface dominated transport. Our results open a path for realization of electric and spintronic devices based on the topological helical surface states.
机译:我们报告拓扑绝缘子Bi_(1.5)Sb_(0.5)Te_(1.8)Se_(1.2)(BSTS)的单晶纳米薄片器件中表面支配传输的实验证据。电阻率测量结果显示出纳米片器件与块状单晶之间的巨大差异。基于两通道模型,对电阻率和霍尔电阻的分析表明,在200 nm厚的BSTS纳米片器件中,可以实现约99%的表面传输贡献。使用具有SiO_2的标准背栅作为介电层,在用100-200 nm厚的薄片制成的器件中观察到了明显的双极电场效应。此外,厚度为596纳米的纳米薄片器件的随角度变化的磁阻被拟合到所施加磁场的垂直分量的通用曲线上。由二维弱反定位拟合获得的相干长度值进一步证实了表面主导的传输。我们的结果为基于拓扑螺旋表面状态的电气和自旋电子器件的实现开辟了道路。

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