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H-stabilized shallow acceptors in N-doped ZnO

机译:N掺杂ZnO中的H稳定浅受体

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摘要

The origin of the p-type conductivity in N-doped ZnO has been a long standing puzzle for many years because isolated N_O is considered to be a deep acceptor. Recently, the p-type doping has been attributed to the shallow acceptor No - VZn complex that is supposedly being converted from a N_(Zn) - V_O complex at the Zn-terminated surface [L. Liu et al., Phys. Rev. Lett. 108, 215501 (2012)]. By performing first-principles calculations, we demonstrate that the p-type N_O - V_(Zn) pair is easy to form in bulk N-doped ZnO through the charge transfer and acceptor-acceptor level repulsion without the need of the special growth surface. More importantly, the N_O - V_(Zn) pair can be further stabilized through hydrogenation, forming the more stable shallow acceptor complexes (N_O - nH) - V_(Zn) (n = 1-2) with an ionization energy of less than 162 meV, in good agreement with the experiment. These new shallow acceptor complexes are proposed to be responsible for the p-type conductivity of the N-doped ZnO.
机译:多年来,N掺杂的ZnO中p型电导率的起源一直是一个难题,因为孤立的N_O被认为是深受体。最近,p型掺杂归因于浅受体No-VZn络合物,据推测是在Zn终止表面[L.]中从N_(Zn)-V_O络合物转化而来的。 Liu等,Phys。牧师108,215501(2012)]。通过执行第一性原理计算,我们证明了p型N_O-V_(Zn)对很容易通过电荷转移和受体-受体能级排斥在大量N掺杂的ZnO中形成,而无需特殊的生长表面。更重要的是,N_O-V_(Zn)对可以通过氢化作用进一步稳定,从而形成电离能小于162的更稳定的浅受体配合物(N_O-nH)-V_(Zn)(n = 1-2)。 meV,与实验结果非常吻合。提出这些新的浅受体配合物负责N掺杂ZnO的p型电导率。

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  • 来源
    《Physical review》 |2015年第23期|235207.1-235207.5|共5页
  • 作者单位

    Key Laboratory of Strongly-Coupled Quantum Matter Physics, Department of Physics and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, Anhui, China;

    Key Laboratory of Strongly-Coupled Quantum Matter Physics, Department of Physics and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, Anhui, China;

    The Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, China,State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275, China;

    National Renewable Energy Laboratory, Golden, Colorado 80401, USA,Beijing Computational Science Research Center, Beijing 100094, China;

    Key Laboratory of Strongly-Coupled Quantum Matter Physics, Department of Physics and Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, Anhui, China;

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  • 关键词

    theories and models of crystal defects; interaction between different crystal defects; gettering effect; Ⅱ-Ⅵ semiconductors;

    机译:晶体缺陷的理论和模型;不同晶体缺陷之间的相互作用;吸气作用Ⅱ-Ⅵ半导体;

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