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Identification of vacancy-type defects in ZnTe using positron annihilation spectroscopy

机译:用正电子an没光谱法鉴定ZnTe中的空位型缺陷

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摘要

The species of defects in Mg_(0.5)Zn_(0.5)Te, Li-doped and P-doped ZnTe samples were investigated by using positron-based experiments. The positron lifetime experiments along with the atomic superposition (AT-SUP) method were used to predict the positron trapping centers in the samples. The results of lifetime of positron were combined with the 2D angular correlation of annihilation radiation (ACAR) experiments to get information on the electronic structure of these defects. The momentum density distributions permitted the vacancy-type defect to be distinguished in each sample. In addition, the results of the 2D-ACAR experiments disclosed a relaxation of the atoms around the vacancy in the P-doped ZnTe sample.
机译:利用基于正电子的实验研究了Mg_(0.5)Zn_(0.5)Te,Li掺杂和P掺杂ZnTe样品中的缺陷种类。使用正电子寿命实验以及原子叠加法(AT-SUP)来预测样品中的正电子俘获中心。将正电子的寿命结果与an灭辐射的二维角相关性(ACAR)实验结合起来,以获得有关这些缺陷的电子结构的信息。动量密度分布允许在每个样品中区分空位型缺陷。此外,2D-ACAR实验的结果表明,P掺杂ZnTe样品中空位周围的原子弛豫。

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