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Luminescent Capillary-Based Whispering Gallery Mode Sensors: Crossing the Lasing Threshold

机译:基于发光毛细管的耳语画廊模式传感器:越过激光阈值

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摘要

Silicon nanocrystals (Si NCs) present many advantages for sensor applications,rnincluding relatively bright and stable luminescence, low-to-negligiblerntoxicity, and high physical and chemical robustness. In this work, the effortsrnin creating capillary-based sensors from smooth films of oxide-embeddedrnSiNCs are summarized, and their responses to dye-doped polymer films arerncompared. The main method is to form sub-micrometer luminescent coatingsrnon microcapillary channel walls. The coating must have a high index ofrnrefraction so that it can support the luminescence whispering gallery modesrn(WGMs) which propagate through the film and extend into the channelrnmedium. Using Si NCs, a general refractometric sensing and the detection ofrnlayer-by-layer polyelectrolyte deposition on the capillary channel are demonstrated.rnThe Si NC sensors are exceptionally robust and can be cleaned andrnre-used multiple times. The main limitation of the method currently involvesrnthe relatively slow detection (requiring typically more than 20 s per collectedrnluminescence spectrum) due to the low light levels associated with the Si NCrnluminescence. Finally, our most recent work is discussed, which aims tornextend the luminescent capillary sensor into the lasing regime.
机译:硅纳米晶体(Si NCs)为传感器应用提供了许多优势,包括相对明亮和稳定的发光,低至可忽略的毒性以及很高的物理和化学稳定性。在这项工作中,总结了从嵌入氧化物的SiNC的光滑膜创建基于毛细管的传感器的努力,并比较了它们对染料掺杂的聚合物膜的响应。主要方法是形成亚微米级的发光涂层或非微毛细管通道壁。涂层必须具有高折射率,以使其能够支持通过膜传播并延伸到通道介质中的发光回音壁模式(WGM)。使用Si NCs进行了常规的折光检测,并检测了毛细管通道上逐层聚电解质的沉积。rnSi NC传感器非常坚固,可以清洗和重复使用多次。由于与Si NC发光相关的低光水平,该方法当前的主要局限性在于相对较慢的检测(每个收集的发光光谱通常要求超过20 s)。最后,讨论了我们的最新工作,其目的是将发光毛细管传感器扩展到激光方案中。

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  • 来源
    《Physica status solidi》 |2018年第7期|1700619.1-1700619.6|共6页
  • 作者单位

    Department of Physics, University of Alberta, Edmonton, AB T6G2E1, Canada;

    Department of Physics, University of Alberta, Edmonton, AB T6G2E1, Canada;

    Department of Physics, University of Alberta, Edmonton, AB T6G2E1, Canada;

    Department of Physics, University of Alberta, Edmonton, AB T6G2E1, Canada;

    School of Engineering and Future Industry Institute, University of South Australia, SA 5095, Mawson Lakes, Australia School of Physical Sciences and Institute for Photonics and Advanced Sensing, University of Adelaide, SA 5000, Adelaide, Australia;

    University of South Australia, SA 5000 Adelaide, Australia;

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