机译:HVPE生长的厚重掺杂p型GaN厚层的电学和光学特性
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Technologies and Devices International, Inc., 12214 Plum Orchard Dr., Silver Spring, MD 20904, USA;
Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215, USA;
Department of Electrical and Computer Engineering, George Mason University, Fairfax, VA 22030, USA;
National Institute of Standards and Technology, 100 Bureau Dr., Gaithersburg, MD 20899, USA;
National Institute of Standards and Technology, 100 Bureau Dr., Gaithersburg, MD 20899, USA;
thin film structure and morphology; Ⅲ-Ⅴ semiconductors; cathodoluminescence; ionoluminescence; Ⅲ-Ⅴ semiconductors; vapor phase epitaxy; growth from vapor phase; light-emitting devices;
机译:封端对HVPE生长的GaN层电学和光学性能的影响
机译:在MOCVD-GaN /蓝宝石模板和氨热GaN种子上生长的HVPE-GaN:结构,光学和电学性质的比较
机译:HVPE生长的厚高掺杂P型GaN层的电气和光学性质
机译:分子束外延生长掺杂杂质的ZnSe层的光致发光和电学性质
机译:快速热退火对原子层沉积生长Zr掺杂ZnO薄膜的结构电学和光学性质的影响
机译:通过HVPE在P型6H-SIC基板上长大的GaN层