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首页> 外文期刊>Photonics Journal, IEEE >Column Address Selection in Optical RAMs With Positive and Negative Logic Row Access
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Column Address Selection in Optical RAMs With Positive and Negative Logic Row Access

机译:具有正逻辑和负逻辑行访问的光学RAM中的列地址选择

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摘要

An optical RAM row access gate followed by a column address selector for wavelength-division-multiplexing (WDM)-formatted words employing a single semiconductor optical amplifier—Mach–Zehnder interferometer (SOA-MZI) is presented. RAM row access is performed by the SOA-MZI that grants random access to a 4-bit WDM-formatted optical word employing multiwavelength cross-phase-modulation (XPM) phenomena, whereas column decoding is carried out in a completely passive way using arrayed waveguide grating. Proof-of-concept experimental verification for both positive and negative logic access is demonstrated for 4 $ times$ 10 Gb/s optical words, showing error-free operation with only 0.4-dB-peak-power penalty and requiring a power value of 25 mW/Gb/s.
机译:提出了一个光学RAM行访问门,其后是一个列地址选择器,用于使用单个半导体光放大器-马赫曾德尔干涉仪(SOA-MZI)进行波分复用(WDM)格式的字。 RAM行访问由SOA-MZI执行,SOA-MZI允许使用多波长交叉相位调制(XPM)现象对4位WDM格式的光学字进行随机访问,而列解码则使用阵列波导以完全无源的方式进行光栅。正向和负向逻辑访问的概念验证实验验证以4乘以10 Gb / s的光字进行了演示,显示了无错误操作,峰值功率损失仅为0.4 dB,要求功率值为25 mW / Gb /秒

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