首页> 外文期刊>Oxidation of Metals >The Effect of Sulfur Segregation on the Adherence of the Thermally-Grown Oxide on NiAl—II: The Oxidation Behavior at 900°C of Standard, Desulfurized or Sulfur-Doped NiAl(001) Single-Crystals
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The Effect of Sulfur Segregation on the Adherence of the Thermally-Grown Oxide on NiAl—II: The Oxidation Behavior at 900°C of Standard, Desulfurized or Sulfur-Doped NiAl(001) Single-Crystals

机译:硫偏析对热生长氧化物在NiAl-II上的附着的影响:标准,脱硫或掺杂NiAl(001)单晶在900°C时的氧化行为

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摘要

In Part II of this study, the characterization by TGA, SEM and AFM of the oxidation behavior at 900°C of NiAl(001) samples with various sulfur concentrations is reported. The formation of interfacial cavities is observed for all samples. A constant ratio of the oxide thickness to cavity depth is found showing that the formation of cavities at the metal–oxide interface is not due to sulfur but only to vacancy injection during the cationic growth of transient θ-alumina. It is also observed that the presence of sulfur in the alloy decreases the oxidation rate of the nickel aluminide and, consequently, lowers the formation of interfacial cavities. This effect is interpreted as an indirect evidence of the control of the transient-alumina growth by the aluminium diffusion in the alloy, also advanced as an explanation for the interfacial nucleation of alpha alumina. These results are combined with those presented in Part I to propose a model that explains how sulfur, present in small quantities in the alloy, has a deleterious effect on the oxide adherence. The indirect role of the cavities formed during the growth of the transient alumina is to create transitory conditions for the rapid segregation of sulfur at the interface. The segregated sulfur remains as a vestige of the initial stages of growth after the transformation of the scale into mature alumina and weakens its adherence.
机译:在本研究的第二部分中,通过TGA,SEM和AFM表征了各种硫浓度的NiAl(001)样品在900°C时的氧化行为。对于所有样品均观察到界面腔的形成。发现氧化物厚度与腔体深度的比率恒定,这表明在金属-氧化物界面处形成腔体的原因不是由于硫,而是仅由于瞬态θ-氧化铝阳离子生长期间的空位注入。还观察到合金中硫的存在降低了铝化镍的氧化速率,因此降低了界面孔的形成。该效应被解释为通过合金中铝的扩散来控制瞬态氧化铝生长的间接证据,也被解释为α氧化铝界面成核的解释。这些结果与第一部分中提出的结果相结合,提出了一个模型,该模型解释了合金中少量存在的硫如何对氧化物附着力产生有害影响。在过渡型氧化铝的生长过程中形成的空腔的间接作用是为过渡态的硫快速迁移创造了过渡条件。在氧化皮转变成成熟的氧化铝后,分离出的硫仍然是生长初期的痕迹,并削弱了其附着力。

著录项

  • 来源
    《Oxidation of Metals》 |2003年第2期|159-178|共20页
  • 作者单位

    Laboratoire de Physico-Chimie des Surfaces CNRS (UMR 7045)—Université Pierre et Marie Curie Ecole Nationale Supérieure de Chimie de Paris;

    Laboratoire de Physico-Chimie des Surfaces CNRS (UMR 7045)—Université Pierre et Marie Curie Ecole Nationale Supérieure de Chimie de Paris;

    Laboratoire de Physico-Chimie des Surfaces CNRS (UMR 7045)—Université Pierre et Marie Curie Ecole Nationale Supérieure de Chimie de Paris;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    sulfur effect; alumina; nickel aluminide; segregation; metal–oxide interface;

    机译:硫效应;氧化铝;铝化镍;偏析;金属-氧化物界面;

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