Nanoscale deformation measurement by using the hybrid method of gray-level and holographic interferometry

摘要

This study extends the use of holographic interferometry to measure the nanoscale out-of-plane displacement with high surface resolution. It is noted that if the deformation is less than half of the optical wavelength, it is hard to find an obvious fringe pattern. Under such a situation, in general, the phase shift method is used. However, it needs to take more than 3 images for phase shifting and phase reconstruction In this paper, a more simple hybrid method of gray-level and holographic interferometry is used to extract fringe skeletons, in which it just needs to take one or two images for the normal deformation measurement directly, even if there exists no obvious fringe pattern. The displacement field with high surface resolution can also be obtained. The proposed method yielded a theoretical precision of 0.15 nm for out-of-plane displacement with a monochromatic CCD camera of 10-bit gray scale (1024 gray scales) sensitivity and microscale surface resolution for millimeter scale object with 640 x 480 pixels image resolution by an He-Ne LASER (632.8 nm wavelength) light source. The gray-level method is proposed to calculate the non-obvious interferometry fringe by traditional holographic interferometry hologram, and the result showed that this method works for this purpose. (c) 2005 Elsevier Ltd. All rights reserved.