...
首页> 外文期刊>Optical Materials >Application of photoconductivity measurements to photodynamic processes1investigation in LiYF_4:Ce~(3+) and LiLuF_4:Ce~(3+) crystals
【24h】

Application of photoconductivity measurements to photodynamic processes1investigation in LiYF_4:Ce~(3+) and LiLuF_4:Ce~(3+) crystals

机译:光电导测量在LiYF_4:Ce〜(3+)和LiLuF_4:Ce〜(3+)晶体光动力学过程中的应用

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Photoconductivity measurements are applied to the studies of photodynamic processes in LiYF_4:Ce~(3+) and LiLuF_4:Ce~(3+) crystals undergoing ultraviolet irradiation. Photoconductivity spectra were registered by means of microwave technique under irradiation at 220-320 nm at the room temperature. Photoconductivity signal appeared at ~300 nm and monotonically increased with the shortening of wavelength. Pumping energy dependencies of photoconductivity within 225-305 nm spectral range were registered and revealed the change of the dependence degree from quadratic at longer wavelengths through linear to saturation-like at shorter ones. Numerical simulation based on four-level model of photodynamic processes was performed. Values and spectral distributions of probabilities of different types of photodynamic processes for 225-295 nm were estimated. Ce~(3+) ions excited-state photoionization cross-section spectra in both investigated materials revealed a band with a peak around 270 nm most probably corresponding to 5d-6s transition of Ce~(3+). Recombination cross-section in Ce:LiLuF_4 appeared to be two orders of magnitude higher than in Ce:LiYF_4. A complete energy level diagram of "Ce~(3+) ion-LiYF_4 crystal" system has been proposed.
机译:光电导率测量被用于研究LiYF_4:Ce〜(3+)和LiLuF_4:Ce〜(3+)晶体在紫外光照射下的光动力学过程。通过微波技术在室温下在220-320nm的辐射下记录光电导光谱。光电导信号出现在〜300 nm处,并随着波长的缩短而单调增加。记录了在225-305 nm光谱范围内光导率的泵浦能量依赖性,并揭示了依赖性程度从较长波长的二次方到线性波长到较短波长的饱和度的变化。基于光动力学过程的四级模型进行了数值模拟。估计了225-295 nm不同类型的光动力过程的概率值和光谱分布。在两种研究材料中,Ce〜(3+)离子的激发态光电离截面光谱均显示一条带,其峰在270 nm附近,最可能对应于Ce〜(3+)的5d-6s跃迁。 Ce:LiLuF_4中的重组横截面似乎比Ce:LiYF_4中的重组横截面高两个数量级。提出了“ Ce〜(3+)离子-LiYF_4晶体”系统的完整能级图。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号