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Model and error analysis for coded structured light measurement system

机译:编码结构化光测量系统的模型与误差分析

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摘要

Coded structured light can rapidly acquire the shape of unknownnsurfaces by projecting suitable patterns onto a measuring surfacenand grabbing distorted patterns with a camera. By analyzing the deformationnpatterns appearing in the images, depth information of the surfacencan be calculated. This paper presents a new concise and efficient mathematicalnmodel for coded structured light measurement system to obtainndepth information. The interrelations among model parameters and errorsnof depth information are investigated. Based on the system geometricnstructure, the results of system parameters affecting object imagingncan be obtained. Also, the dynamic deformation patterns can be capturednunder different measurement conditions. By analyzing the system parametersnand depth information errors, the system constraint conditions cannbe determined, and the system model simulation and error analysis arendiscussed in experiments, too. Also, the system model based on optimalnparameters is utilized to implement reconstruction for two objects.
机译:编码的结构化光可以通过将合适的图案投影到测量表面上并使用相机捕获扭曲的图案来快速获取未知表面的形状。通过分析图像中出现的变形图案,可以计算出表面的深度信息。本文提出了一种新的简洁高效的数学模型,用于编码结构化光测量系统以获取深度信息。研究了模型参数与深度信息误差之间的相互关系。基于系统的几何结构,可以获得影响对象成像的系统参数结果。同样,可以在不同的测量条件下捕获动态变形模式。通过分析系统参数和深度信息误差,可以确定系统约束条件,并在实验中不进行系统模型仿真和误差分析。而且,基于最优参数的系统模型被用于实现两个对象的重构。

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