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Tolerance analysis of misalignment in an optical system using Shack-Hartmann wavefront sensor: experimental study

机译:使用Shack-Hartmann波前传感器的光学系统中未对准的公差分析:实验研究

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摘要

The wavefront aberrations induced by misalignments due to decentration and tilt of an optical component in an optical measurement system are presented. A Shack-Hartmann wavefront sensor is used to measure various aberrations caused due to the shifting of the axis and tilt of a lens in the path of an optical wavefront. One of the lenses in an optical system is decentered in the transverse direction and is tilted by using a rotational stage. For each step, wavefront data have been taken and data were analyzed up to the fourth order consisting of 14 Zernike terms along with peak-to-valley and root mean square values. Theoretical simulations using ray tracing have been carried out and compared with experimental values. The results are presented along with the discussion on tolerance limits for both decentration and tilt.
机译:提出了由于光学测量系统中由于光学组件的偏心和倾斜而导致的未对准引起的波前像差。 Shack-Hartmann波前传感器用于测量由于在光波前路径中轴的移动和透镜的倾斜而引起的各种像差。光学系统中的一个透镜在横向方向上偏心并通过使用旋转镜台倾斜。对于每个步骤,都采集了波前数据,并对数据进行了四阶分析,该阶数包括14个Zernike项以及峰谷和均方根值。已经进行了使用射线追踪的理论模拟,并将其与实验值进行了比较。随同关于偏心和倾斜的公差极限的讨论一起给出了结果。

著录项

  • 来源
    《Optical engineering》 |2015年第7期|075104.1-075104.8|共8页
  • 作者单位

    Elite School of Optometry, Unit of Medical Research Foundation, No. 8, GST Road, St.Thomas Mount, Chennai, Tamil Nadu 600016, India ,SASTRA University, Department of Mathematics, Thirumalaisamudram, Thanjavur, Tamil Nadu 613401, India ,Indian Institute of Technology Madras, Applied Optics Laboratory, Department of Physics, Sardar Patel Road, Adyar, Chennai, Tamil Nadu 600036, India;

    Indian Institute of Technology Madras, Applied Optics Laboratory, Department of Physics, Sardar Patel Road, Adyar, Chennai, Tamil Nadu 600036, India;

    SASTRA University, Department of Mathematics, Thirumalaisamudram, Thanjavur, Tamil Nadu 613401, India;

    Indian Institute of Technology Madras, Applied Optics Laboratory, Department of Physics, Sardar Patel Road, Adyar, Chennai, Tamil Nadu 600036, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    aberrations; Zernike coefficients; decentration; tilt and misalignment;

    机译:像差泽尼克系数分散倾斜和未对准;

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