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Model of thermal infrared image texture generation based on the scenery space frequency

机译:基于风景空间频率的红外热像纹理生成模型

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摘要

Infrared texture is an important feature in identifying scenery. To simulate infrared image texture effectively at different distances, we propose a model of infrared image texture generation based on scenery space frequency and the image pyramid degradation principle. First, we build a spatial frequency filter model based on imaging distance, taking into account the detector's maximum spatial frequency, and use the filter to process a "zero" distance infrared image texture. Second, taking into consideration the actual temperature difference of the scenery's details due to variation of the imaging distance and the effect of atmospheric transmission, we compare the actual temperature difference with the minimum resolvable temperature difference of the thermal imaging system at a specific frequency and produce a new image texture. The results show that the simulated multiresolution infrared image textures produced by the proposed model are very similar (lowest mean square error = 0.51 and highest peak signal-to-noise ratio = 117.59) to the images captured by the thermal imager. Therefore, the proposed model can effectively simulate infrared image textures at different distances.%infrared image texture;spatial filtering;minimum resolvable temperature difference;image pyramid
机译:红外纹理是识别风景的重要特征。为了有效地模拟不同距离的红外图像纹理,我们提出了一种基于风景空间频率和图像金字塔退化原理的红外图像纹理生成模型。首先,我们基于成像距离建立空间频率滤波器模型,同时考虑到探测器的最大空间频率,并使用该滤波器处理“零”距离的红外图像纹理。其次,考虑到由于成像距离的变化和大气传播的影响而导致的风景细节的实际温度差,我们将实际温度差与特定频率下热成像系统的最小可分辨温度差进行比较,并产生新的图像纹理。结果表明,所提出的模型产生的模拟多分辨率红外图像纹理与热成像仪捕获的图像非常相似(最低均方差= 0.51和最高峰值信噪比= 117.59)。因此,该模型可以有效模拟不同距离的红外图像纹理。%红外图像纹理;空间滤波;最小可分辨温差;图像金字塔

著录项

  • 来源
    《Optical engineering》 |2015年第4期|12-19|共8页
  • 作者单位

    Beijing Institute of Technology, Ministry of Education of China, School of Optoelectronics, Key Laboratory of Photoelectronic Imaging Technology and System, Beijing 100081, China;

    Beijing Institute of Technology, Ministry of Education of China, School of Optoelectronics, Key Laboratory of Photoelectronic Imaging Technology and System, Beijing 100081, China;

    Beijing Institute of Technology, Ministry of Education of China, School of Optoelectronics, Key Laboratory of Photoelectronic Imaging Technology and System, Beijing 100081, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    043102-1-043102-8;

    机译:043102-1-043102-8;

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