...
首页> 外文期刊>Optical engineering >Repeatable speckle projector for single-camera three-dimensional measurement
【24h】

Repeatable speckle projector for single-camera three-dimensional measurement

机译:可重复散斑投影仪,用于单摄像机三维测量

获取原文
获取原文并翻译 | 示例
           

摘要

Triangulation-based three-dimensional (3-D) optical metrology utilizing structured illumination requires the projector and camera to be geometrically calibrated. The projection of laser speckle structures in temporal correlation-based methods has been found to be useful for high-speed 3-D measurement. However, it requires the use of a stereo-camera configuration as speckle projection does not utilize conventional projection optics. Previously, we have shown a model-less method to calibrate these unconventional projection systems. This re-enabled single-camera setups where stereo systems used to be required. Due to the random nature of speckle production, speckle structures were not suitable as a set of repeatable illumination structures is needed for the model-less calibration method to succeed. A projection apparatus is proposed, which enables the production of a repeatable set of speckle structures. This device is then utilized in a single-camera optical metrology 3-D measurement system.
机译:利用结构化照明的基于三角测量的三维(3-D)光学计量要求投影仪和照相机进行几何校准。已经发现,在基于时间相关性的方法中激光散斑结构的投影对于高速3-D测量非常有用。但是,由于散斑投影不利用常规的投影光学器件,因此需要使用立体摄像机配置。以前,我们已经展示了一种无模型的方法来校准这些非常规的投影系统。这重新启用了以前需要立体声系统的单相机设置。由于散斑产生的随机性,散斑结构不适合,因为要使无模型校准方法成功需要一组可重复的照明结构。提出了一种投影设备,其使得能够产生可重复的散斑结构组。然后将此设备用于单相机光学计量3-D测量系统。

著录项

  • 来源
    《Optical engineering》 |2018年第12期|120501.1-120501.4|共4页
  • 作者单位

    Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

    Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

    Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

    Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

    Friedrich Schiller University Jena, Institute of Applied Optics, Jena, Germany,Abbe Center of Photonics, Jena, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    speckles; three-dimensional measurement; projector calibration; metrology;

    机译:斑点三维测量投影仪校准;计量学;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号